Evaluating large grain TMR and selective partial reconfiguration for soft error mitigation in SRAM-based FPGAs

摘要

This paper presents an innovative method that allows the use of dynamic partial reconfiguration combined with triple modular redundancy (TMR) in SRAM-based FPGAs fault-tolerant designs. The method combines large grain TMR with special voters capable of signalizing the faulty module and check point states that allow the sequential synchronization of the recovered module with the Xilinx TMR (XTMR) approach. As a result, only the faulty domain is reconfigured, minimizing time and energy spent in the process. In addition, the use of checkpoint states avoids system downtime, since the synchronization of the recovered module is performed while the others are kept running. Experimental results show that the method has a reduced fault recovery time compared to the standard TMR implementation, maintaining the compatible area overhead and performance.