Field Programmable Gate Arrays (FPGAs) are getting more and more attractive for military and aerospace applications, among others devices. The usage of non volatile FPGAs, like Flash-based ones, reduces permanent radiation effects but transient faults are still a concern. In this paper we propose a new methodology for effectively measuring the width of radiation-induced transient faults thus allowing tuning known mitigation techniques accordingly. Radiation experiments results are presented and commented demonstrating that the proposed methodology is a viable solution to measure the transient pulses width.
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