Industrial-camera-based high-power YAG beam profiler

摘要

The increased use of high power Semiconductor lasers for industrial applications has created a demand for accurate, detailed beam profiling devices. Current technology, however, limits the use of conventional beam profiling instruments to about 1.5 kW. We will discuss a novel method of profiling high power YAG (1064 nm) industrial lasers up to 4kW in average power and 30 mm in raw beam diameter, using a camera-based, computer operated beam-profiling device. The new instrument is portable and employs conventional optics to attenuate and reduce the raw beam, and is designed to be used in an industrial environment.