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The Intersection of Controls and Physics in Atomic Force Microscopy

机译:原子力显微镜的控制和物理学

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Not being a control theorist, my goal with this talk isn't to present a significant new result in controls. I'm an experimental physicist with a fairly long background in the design and use of Atomic Force Microscopes (AFM), including several years in companies that build them. My goal with this talk is two-fold. First is to point out some of the areas in AFM where I think controls can make big contributions. I think there are lots of interesting problems to be found and given that there are several thousand AFM's in the world and the market is still growing, it also means that these problems are very relevant (and fundable). Second is to give you a more detailed look into one of these problems - an interesting non-linear dynamics problem that appears in the field. While a fair amount of work has been done on this problem, a better understanding of this problem can lead to improved operation of the microscope.
机译:不是一个控制理论家,我的谈判的目标不是在控件中提出重大的新结果。我是一个实验性物理学家,在设计和使用原子力显微镜(AFM)的设计和使用中,包括建立它们的公司的几年。我的谈话的目标是两倍。首先是指出AFM中的一些领域,我认为控制可以做出大贡献。我认为世界上有很多有趣的问题,并鉴于世界上有几千欧姆AFM,市场仍在增长,这也意味着这些问题是非常相关的(和可调整的问题)。其次是给您一个更详细的研究其中一个问题 - 一个有趣的非线性动态问题出现在字段中。虽然在这个问题上完成了相当数量的工作,但更好地了解这个问题可能导致显微镜的操作改善。

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