We report a new procedure allowing one to use fringe-locked running hologram experiments to characterize photorefractive materials in a very simple, reliable and direct way. This procedure is based on the representation of data in a three dimensional space (diffraction efficiency, frequency detuning and applied electric field) that considerably facilitates data fitting. The latter procedure is evaluated by means of a mathematical simulation. The technique is applied to a photorefractive Bi_(12)TiO_(20) crystal sample in order to verify its adequacy for computing some of the more relevant material parameters: Diffusion length. Debye screening length and quantum efficiency for photoelectron generation. The effectively applied electric field inside the sample is obtained at the same time. The results are in good agreement with already available data for this sample.
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