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Multiple Sensor Fault Isolation Using Contribution Plots without Smearing Effect to Non-Faulty Variables

机译:多个传感器故障隔离使用贡献图对非故障变量的涂抹效果

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Investigating the root causes of abnormal events is a crucial task for an industrial process. When process faults are detected, isolating the faulty variables provides additional information for investigating the root causes of the faults. Numerous data-driven approaches require the datasets of known faults, which may not exist for some industrial processes, to isolate the faulty variables. The contribution plot is a popular tool to isolate faulty variables without a priori knowledge. However, it is well known that this approach suffers from the smearing effect, which may mislead the faulty variables of the detected faults. In the presented work, a contribution plot without the smearing effect to non-faulty variables was derived. A continuous stirred tank reactor (CSTR) example was provided to demonstrate that the proposed approach is not only capable of isolating faulty variables of a simple fault but also a complex fault.
机译:调查异常事件的根本原因是工业过程的关键任务。检测到流程故障时,隔离故障变量提供了用于调查故障根本原因的其他信息。许多数据驱动方法需要已知故障的数据集,这可能不存在于某些工业过程中,以隔离故障变量。贡献曲线是一个流行的工具,可以在没有先验的知识的情况下隔离有错误的变量。然而,众所周知,这种方法遭受涂抹效果,这可能误导检测到的故障的故障变量。在所呈现的工作中,推导出没有对非故障变量的涂抹效应的贡献曲线。提供了一种连续的搅拌釜反应器(CSTR)示例以证明所提出的方法不仅能够隔离一个简单故障的故障变量,还可以是复杂的故障。

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