MEASUREMENT OF COMPLEX PERMITTIVITY AND PERMEABILITY OF HIGH LOSS DIELECTRIC MATERIAL AS A FUNCTION OF TEMPERATURE

摘要

The paper mainly brings forward a new and simple test set measuring the temperature dependence of complex permittivity and permeability of high loss dielectric material covering X band. The temperatures vary from room temperature to 200°C, and the temperature stability is controlled in +- 0.2°C. The transmission line used in this paper is rectangle waveguide. The paper also made calibration kit used in high temperatures and applied TRL calibration method.