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Improvement of High-Temperature Reliability of Ball Bond Using Platinum-Modified Gold Alloy Wires

机译:使用铂改性金合金线改善球键的高温可靠性

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For superior Au/Al ball-bond reliability, we have developed the 3N (>99.9 wt% Au), 2N5 (>99.5 wt% Au) and 2N (>99 wt% Au) Au alloy bonding wires which contain less than 0.1, 0.5 and 1 wt% Pt, respectively. In the thermal aging test of squashed balls of 40μm in diameter, which consists of storage in air at 250°C and evaluation with wire pull and ball shear, it has been found that there are interesting differences in the ball-bond degradation as a function of wire type. Even the samples bonded using the 3N wire with a very small amount of Pt show superior ball-bond reliability compared with those using a 4N (>99.99 wt% Au) wire without any addition of Pt. The ball-bond degradation in the thermal aging test is reduced significantly with increasing Pt content of a wire. From microstructural analysis of the aged 2N ball bonds, the Pt-containing layer, which seems to play a crucial role in improvement of the ball-bond reliability, have been found in the upper part of intermetallic compounds.
机译:对于优越的Au / Al球键可靠性,我们开发了3N(> 99.5wt%au),2n5(> 99.5wt%au)和2n(> 99wt%au)au合金键合线,其含有小于0.1,分别为0.5和1wt%pt。在直径为40μm的压扁球的热老化试验中,由250°C的空气中的储存和用电线拉伸和滚珠剪切评估,发现球键的差异有趣的差异作为功能电线式。甚至使用具有非常少量PT的3N线粘合的样品均显示出与使用4N(> 99.99wt%au)线的粘合可靠性,而没有任何添加Pt。随着电线的Pt含量增加,热老化试验中的球键降解显着降低。从老年2N球键的微观结构分析中,在金属间化合物的上部发现,似乎在改善球键可靠性方面发挥至关重要作用的含Pt层。

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