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Separation between Allowed and Forbidden Component of the He I 447 nm Line in High Electron Density Plasma

机译:在高电子密度等离子体中允许和禁止分离的允许和禁止部件之间的分离

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摘要

Stark broadened He I 447.1 nm line is measured and the dependence of the separationbetween its allowed and forbidden components upon electron density is analyzed. Experimentalresults are compared with computer simulation results and with former experimental results.
机译:STARK扩大了他447.1 NM线测量,分析了在电子密度时允许和禁止分离的分离的依赖性。将实验结果与计算机仿真结果和前实验结果进行比较。

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