METHOD OF DIGITAL CIRCUITS NOISE IMMUNITY MEASUREMENT USING A STANDARD NOISE SIGNAL

摘要

Noise sources in digital circuits and a general method of noise susceptibility measurement were described. The new method of dynamic noise immunity measurement for digital circuits using a wideband white noise generator with possibility of noise bandwidth reduction has been presented. The simulation models were prepared in COMSIS environment both for wideband and narrowband stimuli (Gaussian white noise signals). The experimental results of investigations confirming the effectiveness of the proposed method have been reported and discussed.