Investigation of Cu-Pc Thin Films on ITO Substrate by Using a Near-Field Microwave Microprobe

摘要

The Copper (II) phthalocyanine (Cu-Pc) thin film was deposited on ITO glass by high vacuum evaporation method. In order to study the effect of heat-treatment conditions the film characteristics of CuPc thin films were prepared at room temperature and annealing at various temperatures. The changes of the alpha- and beta- phases of Cu-Pc thin films due to the increasing annealing temperatures were observed by using X-ray diffraction, electronic absorption spectra, and near-field microwave microprobe.