C-language function class for signal processing at ADC testing

摘要

The paper presents some ideas and results from the attempt to create a comprehensive suite of data processing. C-language functions that enables simplifying the development of new, user oriented software for testing analog to digital converters (ADC) according the IEEE standards 1057, 1241 and DYNAD. The developed function class covers both dynamic and histogram based test methods. Nowadays, it is prepared in the form of instrument driver - function panel (*.fp) for the software development package LabWindows/CVI by National Instruments. All functions were developed, debugged and tested in this environment. The paper also contains some results from comparing the new developed function class used in a developed examples of end-user applications with test data processing Matlab software by Kollar and Markus.