首页> 外文会议>International Conference on Nitride Semiconductors >The growth of GaN using plasma assisted metalorganic vapour phase epitaxy
【24h】

The growth of GaN using plasma assisted metalorganic vapour phase epitaxy

机译:使用血浆辅助金属蒸气阶段外延GaN的生长

获取原文

摘要

Conventional metalorganic vapour phase epitaxy (MOVPE) has been very successful in providing high quality GaN films, however, the growth takes place at high temperature and thus requires large flow rates of high purity ammonia. In order to avoid such high and costly use of ammonia, we have developed a novel ultra high vacuum plasma assisted process, which enables us to grow GaN films at much lower temperature (600 to 800°C). Growth takes place at a total pressure of approximately 10{sup}(-4) mbar using flow rates for nitrogen or ammonia of 10 to 30 sccm and metalorganic flow rate of less than 1 sccm for growth rates of 1 μm/h. For growth with nitrogen, active species are provided using a rf plasma source. We have studied the influence of the group-V to group-III ratio on the structural, electrical and optical properties of the films, by varying the metalorganic flow rate. There is an optimum V: III ratio, which results in films with the best crystal quality and the lowest sheet resistivity, however, the optimum V: III ratio for band emission occurs at a different V: III ratio. The films show yellow luminescence the intensity of which also varies with V: III ratio. We have also studied the influence of group-V flow rate on the relative intensities of ions and neutral species produced by the plasma activation process and their influence on the properties of the films.
机译:常规金属有机气相外延(MOVPE)已经在提供高品质的GaN薄膜非常成功的,但是,发生生长在高温下,因此需要高纯度氨的大流量。为了避免这样的高和昂贵的氨的使用,我们已经开发了一种新型的超高真空等离子体辅助处理,这使我们能够在低得多的温度(600〜800℃)生长GaN薄膜。生长发生在大约10 {SUP}的总压力( - 4),使用的流速为氮或为10〜30sccm的和小于1sccm的为1微米/小时的生长速率的有机金属流速氨毫巴。用氮气的增长,使用的是RF等离子体源提供的活性物种。我们研究了V族的至III族比的薄膜结构,电学和光学性质的影响,通过改变有机金属流速。存在一个最佳的五:III比,其结果在用最好的晶体质量和最低的薄层电阻的膜,然而,最佳五:III比为带发射发生在不同的V:III比率。所述膜显示出黄色发光,其中还采用V而变化的强度:III比率。我们还研究了V族流量对离子和由等离子体激活过程以及它们对膜的性能产生的影响中性物质的相对强度的影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号