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EFFECT OF ~(56)Fe ION IMPLANTATION ON MAGNETORESISTANCE OF La_(0.7)Sr_(0.3)MnO_3 THIN FILMS

机译:〜(56)Fe离子注入对La_(0.7)Sr_(0.3)MnO_3薄膜磁阻的影响

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Thin La_(0.7)Sr_(0.3)MnO_3 films were deposited by magnetron sputtering on a SrTiO_3 (100) substrate. The low and moderate ~(56)Fe ion implantation is employed to create point defects and lattice disorder as well as doping by Fe in order to study their influence on magnetoresistance and for tuning of the properties of LSMO thin film. Ion implantation of Fe~+ was carried out as a two step process. The total dose was divided in the relation 1:2.5 on the energies 120 and 350 keV in order to distribute the implanted species and the radiation damage across the whole layer thickness. The total dose was varied between 3.5 x 10~(13) cm~(-2) and 5 x 10~(15) cm~(-2). RBS of He~+ ions in random and channeling direction was used to detect the radiation damage. With increasing implantation dose the temperature of the magnetoresistance maximum shifts to lower temperatures. This shift is correlated with a remarkable broadening of the maximum in MR(5T). For the LSMO thin films investigated here the optimum implantation dose should be ~10~(14) Fe/cm~2. The strong scattering of the resistivity values at low temperature observed for the medium implantation doses is discussed in the frame of phase separation model.
机译:通过SRTIO_3(100)衬底上的磁控溅射沉积薄LA_(0.7)SR_(0.3)MNO_3薄膜。低于和中等〜(56)的Fe离子注入用于产生点缺陷和晶格障碍以及掺杂Fe,以便研究它们对磁阻的影响和调整LSMO薄膜的性能。作为两步过程进行Fe〜+的离子植入。总剂量在能量120和350keV上分配在第1:2.5中,以分配植入物种和整个层厚度的辐射损伤。总剂量在3.5×10〜(13)cm〜(-2)和5×10〜(15)cm〜(-2)之间。他〜+离子的RBS在随机和通道方向上用于检测辐射损伤。随着植入量的增加剂量将磁阻的温度最大转移到较低的温度。这种转变与MR(5T)中最大的显着扩展相关。对于本文研究的LSMO薄膜,最佳植入剂量应为约10〜(14)氟/厘米2。在相分离模型的框架中讨论了对培养基注入剂量观察到的低温下电阻率值的强散射。

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