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I/V characteristics of ZnSe Schottky diodes

机译:Znse肖特基二极管的I / V特征

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The ZnSe sample used to make the Schottky diode was grown using conventional thermal diffusion technique with iodine as the transport agent, and indium was subsequently diffused into. While gold was used for the rectifying contact, indium was used for the ohmic contact. From the analysis of the I/V characteristic of the diodes, it had been concluded that the transport mechanism of the diodes was thermal emission with an ideality factor of 1.4 that shows the important influence of the interfacial layer on the performance of the diode. Limited tunneling nature of the diode was also observed due to the thin depletion layer by the heavy doping. From the general diode equation of I=I{sub}s.exp(V/V{sub}o), we found a relationship of ln(I{sub}s)∝(V{sub}) existed for the diodes.
机译:使用具有碘作为运输剂的常规热扩散技术生长用于制造肖特基二极管的ZnSe样品,随后将铟扩散到。虽然金用于整流接触,但铟用于欧姆接触。从分析二极管的I / V特征的分析中,已经得出结论,二极管的运输机制是热排放,其理想因子为1.4,表明界面层对二极管性能的重要影响。由于薄掺杂层,还观察到二极管的有限隧道性质。来自i = i {sub} s.exp(v / v {sub} o)的一般二极管方程,我们发现了二极管存在的Ln(i {sub} s)α(v {sub})的关系。

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