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Nature of damage in fused silica induced by high-fluence 3-omega 355-nm laser pulses, a multiscale morphology microstructure, and defect chemistry study

机译:高速度3-OMEGA 355-NM激光脉冲,多尺度形态微观结构和缺陷化学研究,融合二氧化硅损伤性质

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The morphology and microstructure of damage sites in high quality fused silica induced by high power UV (355 nm) laser light have been investigated using a suite of microscopic and spectroscopic tools. These include SEM, TEM, microprobe analysis, XPS, SIMS and x-ray micro-tomography utilizing intense synchrotron radiation. Systematic SEM examinations show that the damage sites consist primarily of a molten core region (thermal explosion), surrounded by a near concentric region of fractured material. The latter arises from propagation of lateral cracks induced by the laser- generated shock waves. The size of the overall crater is dependent of the laser fluence, number of pulses, damage history and environment. In particular, differences in morphology of the damage sites are identified: air vs. vacuum; exit (more severe) surface vs. entrance surface; and regular polish (more severe) vs. super polish surfaces. A compaction layer, ~10 microns thick and ~20% higher in density has been identified with x-ray tomography. This layer has further been substantiated by micro-Raman spectroscopy. High resolution microprobe analysis shows that there is no variation in the Si/O stoichiometry of silica in the compaction layer to within ±1.6%. High resolution TEM indicates the absence of crystalline nano-particles of Si in the compaction layer. Macro-(10-0.1 μm) and micro-cracks (200-20 nm) are found, however, in the bright field images. The Si 2p XPS spectra indicates that there is a lower Si~(3+) species on at least the top 2-3 nm of the compaction layer. These findings are critical to the design of a knowledge-based mitigation process for laser damage growth.
机译:使用高功率UV(355nm)激光诱导的高质量熔融二氧化硅中损伤部位的形态和微观结构已经采用了一套微观和光谱工具研究。这些包括SEM,TEM,微探针分析,XPS,SIMS和X射线微断层扫描,利用强烈的同步辐射辐射。系统的SEM检查表明,损伤部位主要由熔融核心区域(热爆炸)组成,被裂缝材料的近同心区域包围。后者源于激光产生的冲击波引起的横向裂缝的传播。整体火山口的大小取决于激光流量,脉冲数,损伤历史和环境。特别地,鉴定了损伤部位的形态的差异:空气与真空;出口(更严重)表面与入口表面;和规则的波兰(更严重)与超级抛光表面。用X射线断层扫描鉴定了压实层,〜10微米厚,密度较高〜20%。该层进一步通过微拉曼光谱证实。高分辨率微探针分析表明,压实层中二氧化硅的Si / O化学计量没有变化,在±1.6%范围内。高分辨率TEM表示不存在压实层中的Si结晶纳米颗粒。然而,在明场图像中发现宏观(10-0.1μm)和微裂纹(200-20nm)。 Si 2P XPS光谱表明,至少在压实层的顶部2-3nm上存在下部Si〜(3+)种。这些发现对于设计激光损伤的知识的缓解过程至关重要。

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