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Switching properties of the Pb/sub 0.9/La/sub 0.1/TiO/sub 3/ thin film

机译:PB / SUB 0.9 / LA / SUB 0.1 / TIO / SUB 3 /薄膜的切换性能

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Switching properties of the Pb/sub 0.9/La/sub 0.1/TiO/sub 3/ thin film have been measured. As the external input pulse voltage increases from 2 to 5 V, the switching time decreases from 0.49 to 0.12 /spl mu/s. The activation energy (E/sub a/) is obtained as 209 kV/cm from the relation between the switching time and the applied pulse voltage. The switched charge densities at 5 V obtained from the hysteresis loop and the polarization switching are 11.69 and 13.02 /spl mu/C/cm/sup 2/, respectively, which agree relatively well with each other and show a difference of 10%. As the top electrode area increases from 3.14/spl times/10/sup -4/ to 5.03/spl times/10/sup -3/ cm/sup -2/, the switching time increases from 0.12 to 1.88 /spl mu/s. As the load resistance increases from 50 /spl Omega/ to 33 k/spl Omega/, the switching time increases from 0.12 /spl mu/s to 9.7 /spl mu/s. These switching characteristics indicate that Pb/sub 0.9/La/sub 0.1/TiO/sub 3/ thin film can be well applied in nonvolatile memory devices.
机译:已经测量了PB / SUB 0.9 / LA / SUB 0.1 / TIO / SUB 3 /薄膜的切换性能。由于外部输入脉冲电压从2到5 V增加,切换时间从0.49减小到0.12 / spl mu / s。激活能量(E / SUB A /)从切换时间与施加的脉冲电压之间的关系获得209kV / cm。从滞后回路和偏振切换获得的5V处的开关电荷密度分别为11.69和13.02 / SPL mu / c / cm / sup 2 /,这与彼此相对较好,显示出10%的差异。由于顶部电极面积从3.14 / SPL时/ 10 / sup -4 /〜5.03 / spl时间/ 10 / sup -3 / cm / sup -2 /时,切换时间从0.12增加到1.88 / spl mu / s增加。随着负载电阻从50 / SPLω/〜33k / SPLω/,切换时间从0.12 / SPL mu / s增加到9.7 / spl mu / s。这些开关特性表明PB / SUB 0.9 / LA / SUB 0.1 / TIO / SUB 3 /薄膜可以很好地应用于非易失性存储器件。

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