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PIXE and magnetic investigations of La_xRe_(1-x)F_3 (RE = Ce, Nd) single crystals

机译:La_xre_(1-x)f_3(re = ce,nd)单晶的单个晶体的PIXE和磁性研究

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The mixed La_xRE_(1-x)F_3 (RE = Ce, Nd) single crystals doped with Gd~(3+) (0.1 mol%) were grown by a modified Bridgmann-Stockbarger method. The PIXE (Proton Induced X ray Emission) method was used to the determination of a composition x of this material. The value of x for these samples does not differ more than 2.5 % and 7.5 % in La_xCe_(1-x)F_3 and La_xNd_(1-x)F_3 respectively, from the assumed one. In addition, concentrations of the doped rare earth atoms were controlled by XRF (X-Ray Fluorescence) method. The abundance of other than Gd~(3+) rare earth impurities was estimated to be below 0.058 at.%. The magnetic susceptibility of the single crystals was measured in the temperature range 4 - 300 K, in a magnetic field B = 0.2 T applied in the crystallographic plane (001) perpendicular to the c-axis (along the a-axis), using the Faraday method. The magnetic susceptibility measurements confirm the lack of Ce~(3+) and Nd~(3+) clusters in the diluted crystals. The effective spins of hosts Ce~(3+) and Nd~(3+) are equal to 1/2 in the temperature range 4 - 300 K.
机译:通过改进的Bridgmann-Stockbrorber方法生长掺杂有Gd〜(3+)(0.1mol%)的单晶体的混合LA_XRE_(1-X)F_3(RE = CE,ND)单晶。 PIXE(质子诱导X射线发射)方法用于测定该材料的组合物x。这些样本的x的值分别在La_xce_(1-x)f_3和la_xnd_(1-x)f_3中不同的2.5%和7.5%,从假定的一个不同。另外,掺杂稀土原子的浓度由XRF(X射线荧光)方法控制。 Gd〜(3+)稀土杂质以外的丰度估计低于0.058。%。在垂直于C轴(沿A轴)的磁场B = 0.2T中,在温度范围内,在温度范围为4-300k,在垂直于C轴(沿A轴)中的磁场B = 0.2T)中测量单晶的磁化率。法拉第方法。磁化率测量确认稀释晶体中缺乏Ce〜(3+)和Nd〜(3+)簇。宿主Ce〜(3+)和Nd〜(3+)的有效旋转等于温度范围4 - 300 K的1/2。

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