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HIGH ASPECT RATIO NANO-SCALE CF{sub}X STRUCTURES FABRICATED BY DEEP-RIE

机译:高纵横比纳米尺度CF {Sub} X结构由深rie制造

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High aspect ratio (>500) nano-scale CF{sub}x (fluorocarbon) "tube" and "test-tube" arrays were realized using Deep Reactive Ion Etching (RIE). Sidewall CF{sub}x nano structures of 200 nm in thickness formed during Deep RIE passivation process were used for the purpose. The film thickness of CF{sub}x was controlled from 200 nm to 500 nm, and the height more than 100 μm was available. As a result, the aspect ratio is larger than 500. This fluorocarbon tube and test-tube array are useful tools for chemical and biological applications.
机译:使用深反应离子蚀刻(RIE)实现了高纵横比(> 500)纳米级CF {亚}×(氟碳化合物)“管”和“试管”阵列。在深钝化过程中形成的厚度为200nm的侧壁CF {亚} X纳米结构用于本用途。 CF {sub} x的膜厚度由200nm至500nm控制,并且可获得超过100μm的高度。结果,纵横比大于500.该氟碳管和试管阵列是化学和生物应用的有用工具。

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