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Novel Bypass Attack and BDD-based Tradeoff Analysis Against All Known Logic Locking Attacks

机译:针对所有已知的逻辑锁定攻击的新型旁路攻击和基于BDD的权衡分析

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Logic locking has emerged as a promising technique for protecting gate-level semiconductor intellectual property. However, recent work has shown that such gate-level locking techniques are vulnerable to Boolean satisfiability (SAT) attacks. In order to thwart such attacks, several SAT-resistant logic locking techniques have been proposed, which minimize the discriminating ability of input patterns to rule out incorrect keys. In this work, we show that such SAT-resistant logic locking techniques have their own set of unique vulnerabilities. In particular, we propose a novel "bypass attack" that ensures the locked circuit works even when an incorrect key is applied. Such a technique makes it possible for an adversary to be oblivious to the type of SAT-resistant protection applied on the circuit, and still be able to restore the circuit to its correct functionality. We show that such a bypass attack is feasible on a wide range of benchmarks and SAT-resistant techniques, while incurring minimal run-time and area/delay overhead. Binary decision diagrams (BDDs) are utilized to analyze the proposed bypass attack and assess tradeoffs in security vs overhead of various countermeasures.
机译:逻辑锁定已成为保护门级半导体知识产权的有希望的技术。然而,最近的工作表明,这种门级锁定技术容易受到布尔满足性(SAT)攻击的影响。为了挫败此类攻击,已经提出了几种耐饱和逻辑锁定技术,这使得输入模式排除不正确键的辨别能力最小化。在这项工作中,我们表明,这种抗性逻辑锁定技术具有自己的独特漏洞。特别是,我们提出了一种新颖的“旁路攻击”,即使应用了不正确的键,也可以确保锁定电路工作。这样的技术使得对敌人的反对者可能对电路上施加的耐饱和保护的类型进行了遗忘,并且仍然能够将电路恢复到其正确的功能。我们表明,这种旁路攻击在各种基准和耐饱和技术方面是可行的,同时产生最小的运行时间和区域/延迟开销。二进制判定图(BDD)用于分析建议的旁路攻击,并评估安全性的权衡与各种对策的开销。

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