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Novel Bypass Attack and BDD-based Tradeoff Analysis Against All Known Logic Locking Attacks

机译:针对所有已知逻辑锁定攻击的新颖旁路攻击和基于BDD的权衡分析

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Logic locking has emerged as a promising technique for protecting gate-level semiconductor intellectual property. However, recent work has shown that such gate-level locking techniques are vulnerable to Boolean satisfiability (SAT) attacks. In order to thwart such attacks, several SAT-resistant logic locking techniques have been proposed, which minimize the discriminating ability of input patterns to rule out incorrect keys. In this work, we show that such SAT-resistant logic locking techniques have their own set of unique vulnerabilities. In particular, we propose a novel "bypass attack" that ensures the locked circuit works even when an incorrect key is applied. Such a technique makes it possible for an adversary to be oblivious to the type of SAT-resistant protection applied on the circuit, and still be able to restore the circuit to its correct functionality. We show that such a bypass attack is feasible on a wide range of benchmarks and SAT-resistant techniques, while incurring minimal run-time and area/delay overhead. Binary decision diagrams (BDDs) are utilized to analyze the proposed bypass attack and assess tradeoffs in security vs overhead of various countermeasures.
机译:逻辑锁定已成为保护门级半导体知识产权的一种有前途的技术。但是,最近的工作表明,这种门级锁定技术易受布尔可满足性(SAT)攻击的影响。为了阻止这种攻击,已经提出了几种抗SAT的逻辑锁定技术,这些技术最小化了输入模式的辨别能力,以排除错误的键。在这项工作中,我们证明了这种抗SAT的逻辑锁定技术具有自己的独特漏洞集。特别是,我们提出了一种新颖的“旁路攻击”,即使在应用了不正确的钥匙时,也可以确保锁定电路正常工作。这种技术使对手有可能会忽略施加在电路上的SAT抵抗保护的类型,并且仍然能够将电路恢复为正确的功能。我们表明,这种绕行攻击在各种基准测试和耐SAT的技术上都是可行的,同时又能最小化运行时间和面积/延迟开销。二进制决策图(BDD)用于分析提议的旁路攻击并评估安全性与各种对策开销之间的权衡。

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