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A 500MHz pipelined burst SRAM with improved SER immunity

机译:一种500MHz流水线爆发SRAM,具有改善的SER免疫力

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One of the components key to increased mobile computer performance is level-2 (L2) cache memory, which is usually a high-frequency synchronous SRAM and typically consumes >2W [1]. This SEAM has to be housed in low-thermal-resistance package suchas the plastic ball grid array (PBGA). Power dissipation must be reduced, since battery life is prolonged and a lower-cost TQFP package can be used. In addition, cosmic-ray-induced single soft errors are becoming a problem, since memory cell nodecapacitance is reduced with reduction of memory cell size [2]. At high altitude (air flight level of 30,000ft), cosmic-ray-induced SER is increased by 2 orders of magnitude. This type soft error is significant for mobile applications.
机译:增加移动计算机性能的组件密钥之一是电平-2(l2)高速缓冲存储器,其通常是高频同步SRAM,通常消耗> 2W [1]。该接缝必须容纳在低热电阻包中的塑料球栅阵列(PBGA)。功耗必须减少,因为电池寿命延长,可以使用较低的TQFP封装。此外,宇宙射线诱导的单一软误差正在成为一个问题,因为利用降低存储器单元尺寸[2],因此存储器单元NodeCacitisce降低了[2]。在高海拔(航空飞行水平为30,000英尺),宇宙射线诱导的Ser增加了2个数量级。这种软错误对于移动应用程序很重要。

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