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Nucleation and Growth of Polycrystalline Diamond Particles on Ceramic Substrates by Microwave Plasma CVD

机译:微波等离子体CVD在陶瓷基材上的多晶金刚石颗粒的成核和生长

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The nature and distribution of diamondparticulates were studied on three different substrates (Si wafer,Si_3N_4 and WC inserts) using microwave plasma CVD.Deposition was carried out under similar conditions for all threematerials. The nucleation and growth rate were studied usingSEM. In addition, the existence of diamond was verified byXRD analysis and Raman spectroscopy. Deposited diamondparticles were detected in all three materials. It has been foundthat the nucleation and growth rate of diamond particles wererapid on the silicon nitride surface. Raman peaks between 1330-1332 cm~(-1) distinctly shows that sp~3 diamond wassuccessfully deposited on the Si wafer, Si_3N_4 and WC inserts.However, the deposition of diamond crystallites was lesshomogeneous in both the Si wafer and WC if compared to theSi_3N_4. The presence of sp~2-bonded (graphite) carbon wasdetected on the Si surface as well as the WC insert. Some of theimportant parameters controlling the deposition and growthrates of diamond particles are discussed.
机译:使用微波血浆CVD的三种不同的基板(Si晶片,Si_3N_4和WC插入物)研究了金刚石的性质和分布。在所有壮大的壮观的类似条件下进行浸渍。研究了USINGSEM的成核和生长速度。此外,验证了钻石的存在性均验证了ByxRD分析和拉曼光谱。在所有三种材料中检测到沉积的金刚体。已经发现金刚石颗粒在氮化硅表面上的金刚石颗粒的成核和生长速率。拉曼峰值在1330-1332cm〜(-1)之间明显地显示,SP〜3金刚石Wassuccessly沉积在Si晶片,Si_3n_4和WC嵌件上。如果与...相比,金刚石微晶的沉积在Si晶片和WC中都是小均匀的。 thesi_3n_4。在Si表面以及WC插入物上均干燥SP〜2键合(石墨)碳。讨论了控制沉积和生长颗粒的沉积和生长的一致参数。

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