Transient surface grating decay analysis using least-squares reconvolution

摘要

We have developed software for non-linear least-squares analysis of transient surface grating signals. It corrects for instrumental distortions using the reconvolution method with an instrumental response profile measured by means of a short-lieved fluorescent wavelength shifter. it provides a more sensitive test of the conformance of the data with its mathematical model, as illustrated with an analysis of typical data from a Silicon sample.