Electrical capacitance tomography (ECT) has been investigated for a decade. It is now the most mature tomography technique for industrial applications. There are two major difficulties with ECT: (1) very small capacitance to be measured and (2) the "soft-field" nature of electric fields. This paper describes the fundamentals of ECT and reports recent advances, including sensor modelling, hardware design, image reconstruction and research applications. Future development of ECT is also discussed.
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