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The stability of oxide TFTs under electrical gate bias and monochromatic light illumination

机译:电栅极偏压下氧化物TFT的稳定性和单色光照射

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Amorphous oxide TFTs have attracted considerable attention for varying display application due to the high field-effect mobility and fairly good uniformity. Oxide TFTs such as IGZO TFTs can be fabricated under low temperature (less than 350 °C) by simple process compatible to commercially available Si:H TFTs fabrication process[l-2]. However, the stability of the oxide TFTs may be a critical issue because of the severe degradation under electrical gate bias and light illumination even though the optical band gap (E_(opt)) is more than 3 eV[3-4].
机译:由于高场效应流动性和相当良好的均匀性,非晶氧化物TFT吸引了相当大的显示应用。通过与市售的Si:H TFT制造工艺[L-2]相容的简单方法,可以在低温(小于350℃)下制造氧化物TFT。然而,氧化TFT的稳定性可能是一个关键问题,因为即使光学带隙(E_(OPT))大于3eV [3-4],也可以是电栅极偏置和光照射下的严重劣化。

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