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CHALLENGE OF PROCESS INTEGRATION IN SILICON-BASED CMOS TECHNOLOGY

机译:基于硅的CMOS技术过程集成的挑战

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Silicon-based IC technology development has kept an incredibly steady pace of progress in the past three decades guided by Moore's Law. As we have seen recently, the pace seems even accelerating rather than showing any sign of slowing. There are growing concerns, however, for such a trend from the viewpoint of technical feasibility and of economical validity. The former subject covers quite a broad spectrum of issues such as lithography, interconnect, transistors leading to more circuit- and system-oriented questions for functional partitioning. The latter starts from return on investment and cost affordability, which results in "who should do what by how much" debates. At this moment, and even in the near future, the process integration phase of IC technology development requires the largest amount of experimental data and resources, which are translated into the number of silicon wafers, run in a development cleanroom. The subject discussed here is how we possibly can technology development methodology in which we achieve the same level of data content with improved efficiency in R&D.
机译:基于硅的IC技术开发在过去的三十年中,在摩尔定律引导的三十年中保持了令人难以置信的进展步伐。正如我们最近看到的那样,节奏似乎甚至加速而不是显示任何减速的迹象。然而,从技术可行性和经济有效性的角度来看,越来越担心这种趋势。前主题涵盖了相当广泛的问题,如光刻,互连,晶体管,导致功能分配的更多电路和系统导向的问题。后者始于投资回报和成本负担性,这导致“谁应该做多少”辩论。此时甚至在不久的将来,IC技术开发的流程集成阶段需要最大的实验数据和资源,这些数据和资源被翻译成硅晶片的数量,在开发洁净室中运行。这里讨论的主题是我们如何如何能够实现技术开发方法,其中我们在研发中实现了具有提高效率的数据内容。

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