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Applications for Parallel Grinding as an Alternative to Chemical Decapsulation in Preparing Packaged Samples for Failure Analysis

机译:平行研磨的应用作为化学解膜在制备用于破坏分析的封装样品时的替代方法

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Acid etching of plastic packages can both remove key evidence and introduce artifacts on decapsulated samples. Parallel grinding offers a non-chemical option for removing package material that can minimize these risks. This technique was used successfully on three different types of failure analysis investigations. It also has potential for supporting the analysis of corrosion defects, though additional work is needed to confirm the utility of parallel grinding in this application.
机译:塑料包装的酸蚀刻可以去除键证据并在解封装的样品上引入伪影。平行研磨提供了一种非化学选项,用于去除可以最小化这些风险的封装材料。该技术在三种不同类型的故障分析调查中成功使用。它还具有支持腐蚀缺陷的分析的可能性,尽管需要额外的工作来确认在本申请中平行磨削的效用。

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