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Analysis of the dv/dt Transient of Enhancement-Mode GaN FETs

机译:增强模式GaN FET的DV / DT瞬态分析

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The higher switching speed of wide bandgap devices requires new analysis to interpret voltage waveforms during turn-on and turn-off transients. Although the Miller effect remains a dominant feature, the conventional Miller plateau equations do not accurately model the dvds/dt for fast-switching devices such as GaN FETs. This paper derives equations for instantaneous dvds/dt based on static datasheet parameters, considering the Miller effect and the displacement of junction capacitance charges through the saturated channel. These equations will be verified with experimental results for an enhancement-mode GaN FET across a range of operating conditions. Furthermore, the peak dvds/dt is predicted using the derived equations, and shown to be more accurate than other models when compared to GaN experimental results.
机译:宽带隙设备的更高的开关速度需要新的分析来解释导通期间的电压波形和关闭瞬态。尽管米勒效应仍然是主导特征,但是传统的米勒平台方程不准确地模拟用于诸如GaN FET的快速切换装置。本文基于静态数据表参数来推导瞬时DVD / DT的方程,考虑米勒效应和结电容通过饱和通道的接合电容充电的位移。这些方程将通过实验结果进行验证,在一系列操作条件下的增强模式GaN FET进行了实验结果。此外,与GaN实验结果相比,使用导出的方程预测峰值DVD / DT,并且显示比其他模型更准确。

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