Structural Defects in Crystals and Techniques for Their Detection

摘要

The typical structural (growth) defects of crystal are classified according to their macroscopic extension and shortly reviewed. Three methods suitable for the study of defects in large single crystals - etching, optical methods (stress birefringence) and X-ray diffraction topography - are explained. Particular emphasis is laid on X-ray topography in its various techniques. Selected examples of X-ray topographic studies of growth defects such as dislocations (including glide and misfit dislocations), striations, growth-sector and vicinal-sector boundaries in crystal of different compositions and grown by different methods are presented.