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Growth of crystalline cobalt ferrite thin films at lower temperatures using pulsed-laser deposition technique

机译:利用脉冲激光沉积技术在较低温度下晶体钴铁氧体薄膜的生长

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Cobalt ferrite thin films were grown on SiO_2/Si(100) substrates using pulsed-laser deposition technique at substrate temperatures ranging from 250 to 600 °C. Thermal expansion mismatch between the film and substrate appears to have a substantial effect on the magnetic properties of the cobalt ferrite films, due to the large magnetoelastic coupling of cobalt ferrite. It was shown in this study, that poly crystalline films with (111)-preferred orientation could be prepared at substrate temperatures as low as 250 °C. The growth of crystalline cobalt ferrite films at such low temperatures indicates the potential to use cobalt ferrite for microelectromechanical systems devices and sensor applications including integration with a wider range of multilayer device structures.
机译:在SiO_2 / Si(100)基板上使用脉冲激光沉积技术在底板温度范围为250至600℃的SiO_2 / Si(100)基板上生长钴铁氧体薄膜。由于钴铁氧体的大磁体耦合,膜和基材之间的热膨胀似乎对钴铁氧体薄膜的磁性有显着影响。本研究显示,具有(111)的聚结晶膜可以在低至250℃的底物温度下制备具有(111)的晶体膜。在这种低温下结晶钴铁氧体薄膜的生长表示使用钴铁氧体用于微机电系统装置和传感器应用,包括与更广泛的多层器件结构的集成。

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