Complex permittivity measurements using a quasi-optical multistate reflectometer

摘要

The complex permittivity of a well established high frequency dielectric has been measured using a quasi-optical multistate reflectometer. The permittivity is determined using two separate methods; one employing waveguide and the other a free-space measurement. The reflectometer is calibrated separately for each technique using free-space and waveguide standards. An analysis of the uncertainties involved in the measurement is given and initial results are presented.