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COMPLEX PERMITTIVITY MEASUREMENT DEVICE, COMPLEX PERMITTIVITY MEASUREMENT METHOD, AND PROGRAM

机译:复杂的介电常数测量装置,复杂的介电常数测量方法和程序

摘要

Provided are a complex permittivity measurement device, a complex permittivity measurement method, and a program capable of highly accurately measuring the complex permittivity of a low permittivity material in a microwave region, using a measurement fixture having a simple structure, without requiring a complex measurement tool. The complex permittivity measurement device (100) comprises a fixture (110), a coaxial connector (120), a network analyzer (130), and an arithmetic processing unit (140). The fixture (110) includes: a circular first electrode (113) and a circular second electrode (111), the flat surfaces of which are disposed in parallel with and opposed to each other ; a circular opening (113b) opened at the center of the first electrode (113); and a central conductor (117) extending along the inside of an outer conductor (125) from the center of the second electrode (111) toward the outside via the circular opening (113b) of the first electrode (113).
机译:提供一种复介电常数测定装置,复介电常数测定方法,以及程序,其能够使用结构简单的测定夹具而无需复杂的测定工具而高精度地测定微波区域中的低介电常数材料的复介电常数的程序。 。复介电常数测量设备(100)包括固定装置(110),同轴连接器(120),网络分析器(130)和算术处理单元(140)。固定件(110)包括:圆形的第一电极(113)和圆形的第二电极(111),其平坦表面彼此平行且相对设置;在第一电极(113)的中央开口的圆形开口(113b)。中心导体(117)从第二电极(111)的中心经由第一电极(113)的圆形开口(113b)沿着外部导体(125)的内部朝向外部延伸。

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