An Improved Microprobe Using Direct Undulator Radiation

摘要

The concept of a microspectrocope using direct undulator radiation is described. This instrument utilizes the quasi monochromatic beam from the first undulator at BESSY without monochromatization. Thus X-ray induced Auger spectroscopy as well as photoemission using the 2eV wide first harmonic of the undulator are possible. Spatial resolution is achieved by an adjustable aperture in front of the sample yielding a diffraction limited resolution of 3-4μm. An improved concept using an ellipsoidal mirror is described resulting in a spatial resolution in the submicrometer range. As an example a microanalysis of Cu(InGa)Se_2, a material used for thin film solar cells, is briefly discussed.