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The influence of interface states on the characteristics of HEMT DC output

机译:界面状态对HEMT直流输出特性的影响

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The influence of interface states on the characteristics of AlGaAs/GaAs high electron mobility transistor (HEMT) direct curent (DC) output has been quantitatively analyzed in the first time using an analytical model of HEMT DC output. Considering the action of the interface states in AlGaAs/GaAs heterostructure, we have analyzed detailedly the effect of interface states on I-V characteristics and transconductance of HEMT. Our calculated results show that the control capability of the gate voltage on the channel current reduces with increasing the density of interface state, the transconductance of device decreases. Hence, the existence of the interface state degrades the performance of HEMT.
机译:界面状态对AlgaAs / GaAs高电子迁移率晶体管(HEMT)直接(DC)输出的特性的影响已经使用HEMT DC输出的分析模型定量分析。考虑到界面状态在AlgaAs / GaAs异质结构中的作用,我们已经分析了界面状态对HEMT的I-V特性和跨导的影响。我们计算的结果表明,随着接口状态的密度,栅极电压对通道电流的控制能力降低,装置的跨导减少。因此,界面状态的存在降低了HEMT的性能。

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