Designing NRS4000 Microprocessor for Testability

摘要

Modern microprocessor integrates many millions of transistors, with a deep pipeline of execution and embedded function blocks, requires the additional desin for testability, to simplify test pattern generation and to decrease test complexity. This paper describes the testability design goals, and strategies used in the development of a 32-bit RISC microprocessor chip NRS4000. It presents the architectures and methodologies used to implement the design choices.