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Achromatic phase-shifting for polarization interferometry

机译:用于极化干涉测量的消色差相移

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Polarization interferometers are widely used in microscopy. In these interferometers, the two beams traverse almost identical paths, so that conventional phase-shifting techniques cannot be used. However, because the two beams leaving a polarization interferometer are orthogonally polarized, it is possible to use a phase shifter operating on the geometric phase to introduce a variable phase shift between the two beams without any change in the optical path difference. Since this phase shift is very nearly independent of the wavelength, small variations of the optical path difference over the field can be mapped accurately, even with white light. Achromatic phase-shifting can also be used with two-wavelength illumination to provide a quick and simple method for profiling surfaces exhibiting steps with heights of a few micrometres.
机译:偏振干涉仪广泛用于显微镜。在这些干涉仪中,两个光束遍历几乎相同的路径,从而不能使用传统的相移技术。然而,因为留下偏振干涉仪的两个光束是正交极化的,所以可以使用在几何相位上操作的移相器,以在两个波束之间引入变相移位而没有光学路径差的任何改变。由于该相移非常差别与波长无关,因此即使有白光也可以精确地映射到该字段上的光路径差的小变化。消色差相移也可以与双波长照明一起使用,以提供一种快速简便的方法,用于分析表面具有少量微量的高度。

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