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X-ray Analysis of the Cd_(0.5)Ge_(0.5)Cr_2Se_4 and CdCr_(1.9)Ge_(0.075)Se_4 Compounds

机译：CD_（0.5）GE_（0.5）CR_2SE_4和CDCR_（1.9）GE_（0.075）SE_4化合物的X射线分析

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The polycrystalline Cd_(0.5)Ge_(0.5)Cr_2Se_4 and CdCr_(1.9)Ge_(0.075)Se_4 compounds were obtained using ceramic method. X-ray analysis was used to make phase and structure analysis. The Rietveld method was applied for structure refinement. Both compounds crystallized in cubic, normal spinel structure, Fd 3 m. Besides the main spinel phase, Cr_2Se_3 was observed.

机译：使用陶瓷方法获得多晶CD_（0.5）GE_（0.5）CR_2SE_4和CDCR_（1.9）GE_（0.075）SE_4化合物。 X射线分析用于进行相位和结构分析。 RIETVELD方法应用于结构细化。两种化合物在立方，正常尖晶石结构中结晶，FD 3米。除了主尖晶石相，观察到CR_2SE_3。

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《Conference on Applied Crystallography》|2007年||共2页
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作者
Ewa Maciazek; Tomasz Goryczka; Izabela Jendrzejewska;
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正文语种
中图分类装饰工业和精密仪器原料;
关键词
spinel; rietveld refinement; X-ray-diffraction; ceramic method;

机译：尖晶石;RIETVELD改进;X射线衍射;陶瓷方法;

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4. X-ray Analysis of the Cd_(0.5)Ge_(0.5)Cr_2Se_4 and CdCr_(1.9)Ge_(0.075)Se_4 Compounds [C] . Ewa Maciazek, Tomasz Goryczka, Izabela Jendrzejewska Conference on Applied Crystallography . 2007

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7. X-ray Analysis of the Cd0.5Ge0.5Cr2Se4 and CdCr1.9Ge0.075Se4 Compounds. [O] . Ewa Maciąŝeka, Tomasz Goryczka, Izabela Jendrzejewskac 2015

机译：Cd0.5Ge0.5Cr2se4和CdCr1.9Ge0.075se4化合物的X射线分析。

X-ray Analysis of the Cd_(0.5)Ge_(0.5)Cr_2Se_4 and CdCr_(1.9)Ge_(0.075)Se_4 Compounds

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