STRUCTURAL CHARACTERIZATION OF SSZ-26 AND SSZ-33 MOLECULAR SIEVES BY HIGH RESOLUTION ELECTRON MICROSCOPY AND ELECTRON DIFFRACTION

摘要

Framework structures of SSZ-26 and SSZ-33 molecular sieves have been characterized in detail by using high resolution electron microscopy (HREM) and electron diffraction techniques. SSZ-26 and SSZ-33 have similar 3-D pore systems. They are the intergrowth of two end members which have intersecting 10- and 12-member rings. Direct evidence for the two polymorphs and stacking faults has been obtained. For the first time, the 2-D, 3-connected structural net for the projected framework structure has been successfully derived from experimental high resolution images.