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Design of a Charge Sensitive Amplifier for Silicon Particle Detector in BCD 180 nm Process

机译:BCD 180nm工艺中硅粒子检测器的电荷敏感放大器的设计

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This paper presents the design of a charge sensitive amplifier (CSA) for an analog processing circuit of 47 × 6 silicon pixel detector array. The design has been implemented in BCD 180 nm technology. A diode with an area of 250 × 50 μm2 is used to realize a unit sensor pixel. A 100 % fill factor is achieved by confining the analog circuit in the diode. Low power and area efficient single ended folded cascode amplifier is employed as a basic building block of the CSA. Further, an on-chip corner control circuit is proposed to make the design insensitive to process variations and to reduce power dissipation in the CSA.
机译:本文介绍了47×6硅像素检测器阵列的模拟处理电路的电荷敏感放大器(CSA)的设计。该设计已在BCD 180 NM技术中实现。面积为250×50μm的二极管 2 用于实现单位传感器像素。通过限制二极管中的模拟电路来实现100%填充因子。低功耗和面积有效的单端折叠共级码放大器作为CSA的基本构建块。此外,提出了片上拐角控制电路以使设计对处理变化不敏感并降低CSA中的功耗。

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