Development of Low noise Charge Sensitive Pre-Amplifier in high photon rate applications for Silicon Drift Detector

摘要

The design, development and testing of a Charge Sensitive Pre-Amplifier (CSPA) for Silicon Drift Detector (SDD), working in the soft X-ray energy ranging from 1 to 30keV, is discussed in this paper. The system noise required to detect sub-keV energy (equivalent to ~100 μV baseline fluctuation) photon along with high count rate handling capability (~ 200 kcps; requiring high bandwidth) is the salient feature of this work. The CSPA is tested with high count rate (requiring lower shaping time ~ 0.2 μs) input X-ray source and the spectra obtained for the source is analyzed. The measurement of optimum shaping time and system performance study over the entire detection energy band for multiple X-ray energy lines are also carried out and the test results are discussed.