A single six-port reflectometer measures the scattering parameters of two-port microwave devices

摘要

A single six-port reflectometer configuration is proposed to measure the four scattering parameters of two-port microwave devices. In order to determine the transmission coefficients, only one calibration standard and three measurements are required to complete the calibration procedure. Furthermore, s/sub 12/ and s/sub 21/ can be measured without reversing the device under test.