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Checksum-based concurrent error detection in linear analog systems with second and higher order stages

机译:具有第二和高阶阶段的线性模拟系统中基于校验和的并发错误检测

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The problem of concurrent error detection in a class of linear analog systems containing second and higher order stages is discussed in this paper. Individual stages of such systems have transfer functions whose denominators contain the terms s/sup 2/,s/sup 3/,. . ., where s is the complex frequency of the transfer function H/sub i/(s) of the i'th stage. Such systems are widely used to realize a variety of analog and switched-capacitor filters and control systems. The author assumes that a fault can cause the value of a passive circuit component to deviate from its normal value, result in a short or an open line or change the operating characteristics of the operational amplifiers. A small amount of additional hardware is used to perform error detection, its size being virtually independent of the size of the circuit on which error detection is to be performed. Further, the sensitivity of the error detection scheme to changes in the component values can be easily adjusted.
机译:本文讨论了包含第二和高阶阶段的一类线性模拟系统中并发错误检测的问题。这些系统的个别阶段具有转移函数,其分母包含S / SUP 2 /,S / SUP 3 /,。 。 。,其中S是第i阶段的传递函数h / sub i / sto的复频率。这些系统广泛用于实现各种模拟和开关电容器滤波器和控制系统。作者假设故障可能导致无源电路组件的值偏离其正常值,导致短路或开路或改变操作放大器的操作特性。少量额外的硬件用于执行错误检测,其尺寸实际上与要执行错误检测的电路的大小无关。此外,可以容易地调整错误检测方案对组件值的变化的灵敏度。

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