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Temperature Characteristics of Pure Shear Mode FBARs Consisting of (1120) Textured ZnO Films

机译:由(1120)纹理ZnO薄膜组成的纯剪切模式的温度特性FBAR

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Thickness extensional mode FBAR consisting of (0001) textured ZnO films and pure thickness shear mode FBAR consisting of (1120) textured ZnO films were fabricated. Temperature coefficients of frequency (TCF) of these FBARs were measured in the temperature range of 10-60°C. In both of the resonators, the parallel resonant frequencies varied linearly with temperature. The TCF were determined as -63.1 [ppm/°C]for thickness extensional mode resonator and -34.7 [ppm/°C] for pure-shear mode resonator.
机译:由(1120)纹理ZnO薄膜组成的(0001)纹理ZnO膜和纯厚度剪切模式FBAR的厚度伸缩模式FBAR由(1120)纹理ZnO膜组成。在10-60℃的温度范围内测量这些FBAR的频率(TCF)的温度系数。在两个谐振器中,并联谐振频率随温度而变化。用于厚度伸缩模式谐振器的TCF为-63.1 [PPM /°C],用于纯剪切模式谐振器的-34.7 [PPM /°C]。

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