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A Brief Review of Recent Studies on Performance Improvement of Graphene Nanoribbon Interconnect

机译:浅谈近期石墨烯纳米架互连性能改进研究的研究

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An excellent and distinct metal, Copper (Cu), continued to be an extensively used interconnect material for years. But today, with shrinking technology from millimeter to nanometer scale, Cu suffered tremendous reliability effects as interconnect material such as low electrical and thermal conduction, skin effect, parasitic effects, small mean free path (MFP), stress, etc. These issues triggered to seek for an alternative material whose performance would not degrade with scaling down of integrated circuits. Researchers in late found a material, Graphene, that appreciably supersede Cu as an interconnect material in the nanoscale technology. It is found from different proposed models, simulations, and analyses that Graphene nanoribbon’s (GNR) performance did not deteriorate with the variation of length, width, temperature and also doping with other materials. Still, its performance was comparatively smoother than other interconnect materials. In this article, the performance of GNR and its types for various performance parameters like resistance, delay, crosstalk, bandwidth, power, etc., over traditional interconnect materials are reviewed and discussed.
机译:优异且不同的金属铜(Cu)继续是多年来广泛使用的互连材料。但今天,随着从毫米到纳米刻度的缩小技术,Cu遭受了巨大的可靠性效应,作为互连材料,如低电传导,皮肤效果,寄生效应,小均值的自由路径(MFP),应力等。这些问题触发到寻求替代材料,其性能不会降低集成电路的缩放。迟到的研究人员发现了一种材料,石墨烯,明显取代Cu作为纳米级技术中的互连材料。从不同的拟议模型,模拟和分析中发现,石墨烯纳米(GNR)性能不会随着长度,宽度,温度和掺杂与其他材料的变化而恶化。尽管如此,其性能比其他互连材料相对较为光滑。在本文中,综述并讨论了GNR及其各种性能参数的性能和其类型的性能,如电阻,延迟,串扰,带宽,功率等。

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