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Investigation of Application-Specific Bias Conditions and Dose Rate Dependency in Total Ionizing Dose (TID) Response

机译:施用特异性偏置条件和剂量率依赖性对总电离剂量(TID)反应的研究

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摘要

This paper investigates flight circuit application bias and irradiation dose rate dependencies ("test as you fly" conditions) in the total ionizing dose (TID) response of various electronic components considered for use in a space radiation environment.
机译:本文研究了飞行电路施用偏置和辐照剂量率依赖性(当您在空间辐射环境中使用的各种电子元件的总电离剂量(TID)响应中的总电离剂量(TID)响应。

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