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Effect of Sn doping in CuGaS_2 thin films deposited by chemical spray pyrolysis

机译:SN掺杂在化学喷雾热解沉积Cugas_2薄膜中的影响

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Engineering of sub-bandgap using intermediate states in a wide bandgap semiconductor is promising for high-efficiency photovoltaic technology. The direct bandgap of 2.46 eV in the green part of the visible spectrum attracts the chalcopyrite CuGaS_2 (CGS) as a host for Intermediate Band solar cell applications. Pristine and tin (Sn) doped CGS (CuGa_(1-x)Sn_xS_2) crystalline thin films were deposited using chemical spray pyrolysis method, and their structural and optical properties are characterized.CuGa_(1-x)Sn_xS_2 were subjected to XRD, DRS absorption spectroscopy, and X-ray photoelectron spectroscopy (XPS) measurements.The measured XRD diffraction peaks of the thin films revealed chalcopyrite tetragonal structure without any presence of secondary phases (Cu_2S, CuO, SnO_2, and Ga_2S_3). The substitutional doping of Sn is evidenced by a lower 2θ angle shift of XRD peaksFig.1Absorbance spectra of CuGa_(1-x)Sn_xS_2 films due to the larger atomic radius of Sn (0.69 Å) than that of Ga (0.62 Å). The Sn doping has affected the sub-bandgap absorption spectra and bandgaps of CGS films. Apart from primary strong absorbance edges at 490 nm (Fig.1), strong shoulder absorbance edges are also observed in the NIR region between 1000 to 1600 nm for the Sn doped films, and Tauc-plot analyses revealed below-bandgap responses at around 1.25 eV while the host bandgaps were estimated at 2.49 eV.
机译:使用宽带隙半导体中的中间状态的子带隙的工程是高效的光伏技术的希望。在可见光谱的绿色部分中的2.46eV的直接带隙吸引了作为中间带太阳能电池应用的卤代铜矿Cugas_2(CGS)。使用化学喷雾热解法沉积原始和锡(Sn)掺杂CGS(Cuga_(1-x)Sn_xS_2)结晶薄膜,其结构和光学性质的特征在于。CUGA_(1-X)SN_XS_2进行XRD,DRS吸收光谱和X射线光电子能谱(XPS)测量。薄膜的测量XRD衍射峰揭示了无次相(Cu_2S,CuO,SnO_2和Ga_2S_3)的任何存在的黄铜矿四方结构。 SN的替代掺杂可以通过XRD峰的较低2θ角偏移来证明由于Sn(0.69埃)的较大原子半径(0.62),Cuga_(1-x)Sn_XS_2膜的图1AbsorbanceStha。 Sn掺杂影响了CGS薄膜的子带隙吸收光谱和带隙。除了在490nm(图1)时的初级强吸光度边缘外,对于Sn掺杂薄膜,在1000至1600nm之间的NIR区域中也观察到强的肩部吸光度边缘,并且Tauc-Plot分析显示在1.25左右的带隙响应下方EV估计在2.49eV中估计主带点。

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