Magnetoresistive Properties of Thin-film Systems Based on Permalloy and Silver

摘要

Measurements of phase state, crystal structure, and magnetoresistive properties were carried out on as-deposited and annealed up to 500 and 700 K thin-film systems based on ferromagnetic alloy Ni80 Fe20 and noble metal Ag. The concentration of Ag atoms was chosen of 60 at.%. The thickness of the samples ranged from 20 to 100 nm. Microscopy shows that the phase state of the thin-film systems stayed unchanged before and after annealing up to 700 K. It was found that the as-deposited samples exhibit a negative magnetoresistance regardless of their thickness. The annealing up to 700 K leads to a decrease in the value of magnetoresistance and appearing of the anisotropic magnetoresistive effect.