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Positron Annihilation in ZnO based varistor doped with Semiconductor Additives

机译:ZnO基压敏电阻中的正电子湮灭掺杂有半导体添加剂

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Coincidence Doppler broadening spectra measurements on ZnO-based varistor doped with semiconductor additives have been investigated, and the proposed samples exhibit different characteristics. The peak of the ratio curve of pure zinc is the highest, the Positron Lifetime in sample a03 doped with ZT is the longest. The maximum probability of the positron-3d electron occurs in sample doped with semi-ZnO (sintered at 1300°C for 2h with conventional ceramic processing method). The electrical characteristics of the samples and the behavior of positrons in ZnO-based varistor have been discussed.
机译:研究了掺杂基于ZnO的压敏电阻的重合多普勒展现光谱测量,并且已经表现出不同的特性。纯锌的比率曲线的峰值是最高的,样品A03中的正电子寿命掺杂ZT是最长的。在掺杂用半ZnO的样品中,正电子-3D电子的最大概率发生(用常规陶瓷加工方法烧结在1300℃下烧结2小时)。已经讨论了样品的电气特性和基于ZnO的压敏电阻中的正弦的行为。

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