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Impact of package inductance and DQ driver strength on the 3rd harmonic EMI from DRAM

机译:封装电感和DQ驱动器强度对DRAM的3 rd 谐波EMI的影响

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This paper describes the impact of DRAM-caused power noise (especially simultaneous switching output noise) in DDR2 667 system. The power noise is regulated by adjusting the package inductance of power delivery nets, DQ driver strength, and the power supply voltage. The package inductances of core power delivery net (VDD/VSS) and the DQ power delivery net (VDDQ/ VSSQ) are controlled by adjusting the number of solder balls on package. Also, the DQ power noise is controlled by adjusting DQ driver strength. The power supply level adjusts to control both core and DQ power noises. In summary, DRAM power noise is closely related to the radiated emission, and DRAM power noise should be properly controlled to reduce EMI in digital system.
机译:本文介绍了DDR2 667系统中DRAM引起的电源噪声(尤其是同时开关输出噪声)的影响。通过调整供电网络的封装电感,DQ驱动器强度和电源电压来调节电源噪声。内核供电网(VDD / VSS)和DQ供电网(VDDQ / VSSQ)的封装电感通过调整封装上的焊球数量来控制。另外,通过调节DQ驱动器强度来控制DQ功率噪声。调整电源电平以控制核心和DQ电源噪声。总而言之,DRAM功率噪声与辐射发射密切相关,应适当控制DRAM功率噪声以降低数字系统中的EMI。

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